The test resolution mechanic is based on the CUE system developed by Catalyst Game Labs, first for their Valiant Super Hero RPG and used modified later for Shadowrun: Anarchy and Mechwarrior: Destiny. I wanted to keep things quick and fun, while keeping a measure of randomness and uniqueness for each character, so I chose the mechanics from Shadowrun: Anarchy as the basis for our game:
Skill Dice + Attribute Dice + Modifiers (if any) + Shadow Amps effect (if any) vs. Opposing Dice
Glitches and Exploits
The Glitch Die adds a bit more color to a test, where the GM or a player spends a Plot Point to use it in a roll. This die should be visibly different from the rest of the dice. If it comes up a 1, a glitch has occurred. An exploit happens when the Glitch Die comes up as a 5 or 6. Whether the overall roll was a success or failure for the action, a glitch adds an unexpected stroke of bad luck, whereas an exploit indicates a windfall of some kind.
The result is based on the number of hits, which is +1 for each die that has rolled a five or six. Spending a point of Edge adds any die with a four, as well. Use Edge wisely. As you can imagine this method uses a lot of 6 sided dice. Difficulty level determines the number of opposing dice for a given test:
Very Easy: 4 dice Easy: 6 dice Average: 8 dice Hard: 10 dice Very Hard: 12 dice
All things being equal, the maximum natural level for an attribute for a character is six (the limit for Human characters in Shadowrun: Anarchy).